Yilmaz, S. Et Al. 2019. Determination of optimum Er-doping level to get high transparent and low resistive Cd1-xErxS thin films. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.6 , 5662-5669.

Yilmaz, S., Polat, İ., Tomakin, M., & Bacaksız, E., (2019). Determination of optimum Er-doping level to get high transparent and low resistive Cd1-xErxS thin films. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.6, 5662-5669.

Yilmaz, S. Et Al. "Determination of optimum Er-doping level to get high transparent and low resistive Cd1-xErxS thin films," JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.6, 5662-5669, 2019

Yilmaz, S. Et Al. "Determination of optimum Er-doping level to get high transparent and low resistive Cd1-xErxS thin films." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.6, pp.5662-5669, 2019

Yilmaz, S. Et Al. (2019) . "Determination of optimum Er-doping level to get high transparent and low resistive Cd1-xErxS thin films." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.6, pp.5662-5669.

@article{article, author={S. Yilmaz Et Al. }, title={Determination of optimum Er-doping level to get high transparent and low resistive Cd1-xErxS thin films}, journal={JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS}, year=2019, pages={5662-5669} }