H. Kargi, "Direct quantitative diffractometric analysis of finite-thick samples revisited," 6th International Congress on Applied Mineralogy (ICAM 2000) , Göttingen, Germany, pp.819-822, 2000
Kargi, H. 2000. Direct quantitative diffractometric analysis of finite-thick samples revisited. 6th International Congress on Applied Mineralogy (ICAM 2000) , (Göttingen, Germany), 819-822.
Kargi, H., (2000). Direct quantitative diffractometric analysis of finite-thick samples revisited . 6th International Congress on Applied Mineralogy (ICAM 2000) (pp.819-822). Göttingen, Germany
Kargi, H. "Direct quantitative diffractometric analysis of finite-thick samples revisited," 6th International Congress on Applied Mineralogy (ICAM 2000), Göttingen, Germany, 2000
Kargi, H. "Direct quantitative diffractometric analysis of finite-thick samples revisited." 6th International Congress on Applied Mineralogy (ICAM 2000) , Göttingen, Germany, pp.819-822, 2000
Kargi, H. (2000) . "Direct quantitative diffractometric analysis of finite-thick samples revisited." 6th International Congress on Applied Mineralogy (ICAM 2000) , Göttingen, Germany, pp.819-822.
@conferencepaper{conferencepaper, author={H Kargi}, title={Direct quantitative diffractometric analysis of finite-thick samples revisited}, congress name={6th International Congress on Applied Mineralogy (ICAM 2000)}, city={Göttingen}, country={Germany}, year={2000}, pages={819-822} }