Alver, U. 2002. Roughness analysis of CVD Cu films on different substrates by AFM imaging. JOURNAL OF MATERIALS ENGINEERING AND PERFORMANCE , vol.11, no.6 , 622-624.

Alver, U., (2002). Roughness analysis of CVD Cu films on different substrates by AFM imaging. JOURNAL OF MATERIALS ENGINEERING AND PERFORMANCE , vol.11, no.6, 622-624.

Alver, ÜMİT. "Roughness analysis of CVD Cu films on different substrates by AFM imaging," JOURNAL OF MATERIALS ENGINEERING AND PERFORMANCE , vol.11, no.6, 622-624, 2002

Alver, ÜMİT. "Roughness analysis of CVD Cu films on different substrates by AFM imaging." JOURNAL OF MATERIALS ENGINEERING AND PERFORMANCE , vol.11, no.6, pp.622-624, 2002

Alver, U. (2002) . "Roughness analysis of CVD Cu films on different substrates by AFM imaging." JOURNAL OF MATERIALS ENGINEERING AND PERFORMANCE , vol.11, no.6, pp.622-624.

@article{article, author={ÜMİT ALVER}, title={Roughness analysis of CVD Cu films on different substrates by AFM imaging}, journal={JOURNAL OF MATERIALS ENGINEERING AND PERFORMANCE}, year=2002, pages={622-624} }