Sogut, O. Et Al. 2014. Examination of CoNiCu thin films by using XRF and XRD. CANADIAN JOURNAL OF PHYSICS , vol.92, no.5 , 435-439.

Sogut, O., Donuk, C., APAYDIN, G., & Bakkaloglu, O. F., (2014). Examination of CoNiCu thin films by using XRF and XRD. CANADIAN JOURNAL OF PHYSICS , vol.92, no.5, 435-439.

Sogut, O. Et Al. "Examination of CoNiCu thin films by using XRF and XRD," CANADIAN JOURNAL OF PHYSICS , vol.92, no.5, 435-439, 2014

Sogut, O. Et Al. "Examination of CoNiCu thin films by using XRF and XRD." CANADIAN JOURNAL OF PHYSICS , vol.92, no.5, pp.435-439, 2014

Sogut, O. Et Al. (2014) . "Examination of CoNiCu thin films by using XRF and XRD." CANADIAN JOURNAL OF PHYSICS , vol.92, no.5, pp.435-439.

@article{article, author={O. Sogut Et Al. }, title={Examination of CoNiCu thin films by using XRF and XRD}, journal={CANADIAN JOURNAL OF PHYSICS}, year=2014, pages={435-439} }