Large-Scale Pairwise Sequence Alignments on a Large-Scale GPU Cluster


Savran I., Gao Y., Bakos J. D.

IEEE DESIGN & TEST, vol.31, no.1, pp.51-61, 2014 (Peer-Reviewed Journal) identifier identifier

  • Publication Type: Article / Article
  • Volume: 31 Issue: 1
  • Publication Date: 2014
  • Doi Number: 10.1109/mdat.2013.2290116
  • Journal Name: IEEE DESIGN & TEST
  • Journal Indexes: Science Citation Index Expanded, Scopus
  • Page Numbers: pp.51-61