Determination of K shell fluorescence yields of hf compounds at 123.6 keV
6th International Conference of the Balkan-Physical-Union, İstanbul, Türkiye, 22 - 26 Ağustos 2006, cilt.899, ss.163-164, (Tam Metin Bildiri)
- Yayın Türü: Bildiri / Tam Metin Bildiri
- Cilt numarası: 899
- Doi Numarası: 10.1063/1.2733087
- Basıldığı Şehir: İstanbul
- Basıldığı Ülke: Türkiye
- Sayfa Sayıları: ss.163-164
- Karadeniz Teknik Üniversitesi Adresli: Evet
Özet
The aim of this study was to determine of K shell fluorescence yields (omega(K)) of Hf compounds. The targets were irradiated with gamma-photons at 123.6 keV from Co-57 annular source. The K X-rays from different targets were dedected using a (Ultra-LEGe) semiconductor dedector with a resolution of 150 eV at 5.9 keV. The measured K shell fluorescence yields results compare with the literature semi-emprical prediction that taken from Krause [1].