Modeling stand parameters for Pinus brutia (Ten.) using airborne LiDAR data: a case study in Bergama


Kanja K., KARAHALİL U., Cil B.

JOURNAL OF APPLIED REMOTE SENSING, vol.14, no.2, 2019 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 14 Issue: 2
  • Publication Date: 2019
  • Doi Number: 10.1117/1.jrs.14.022205
  • Journal Name: JOURNAL OF APPLIED REMOTE SENSING
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Keywords: forest stand parameters, remote sensing, light detection and ranging, WorldView-3, Pinus brutia, Bergama, LASER SCANNER DATA, TREE HEIGHT, VOLUME, IMAGERY, LANDSAT, BIOMASS, SAMPLES, FUSION
  • Karadeniz Technical University Affiliated: Yes

Abstract

Traditional field measurement methods are usually time-consuming and costly. With recent developments in remote sensing, precise estimation of some key forest parameters is becoming a close reality. One of the robust technologies being utilized for this aim is light detection and ranging (LiDAR). We used LiDAR to derive tree height and canopy density metrics using pixel values, texture features, and vegetation indices obtained from WorldView-3 imagery to estimate volume per hectare, mean height, dominant height, and number of trees per hectare. A total of 58 sample plots, predominantly composed of Pinus brutia, which is one of the most abundant tree species in Turkey, were analyzed. The adjusted R-2 values obtained by the best regression models, using LiDAR-derived metrics alone, were 0.66, 0.73, 0.83, and 0.83 for the volume per hectare, number of trees per hectare, and average and dominant heights, respectively. After integrating LiDAR-derived metrics with WorldView-3 imagery band values and subsequently with vegetation indices, higher adjusted R-2 values of 0.70 and 0.77, respectively, were obtained for the volume per hectare. In contrast, incorporating texture features besides other parameters had no positive effect on the accuracy of estimation. (C) 2019 Society of Photo-Optical Instrumentation Engineers (SPIE)