Parameter Retrieval of Samples on a Substrate From Reflection-Only Waveguide Measurements

Hasar U. C., Ozturk H., Kaya Y., Izginli M., ERTUĞRUL M.

IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, cilt.31, sa.3, ss.320-323, 2021 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 31 Sayı: 3
  • Basım Tarihi: 2021
  • Doi Numarası: 10.1109/lmwc.2020.3046697
  • Dergi Adı: IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, PASCAL, Aerospace Database, Communication Abstracts, Compendex, INSPEC, Metadex, Civil Engineering Abstracts
  • Sayfa Sayıları: ss.320-323
  • Karadeniz Teknik Üniversitesi Adresli: Hayır

Özet

A microwave method has been proposed for constitutive parameters' extraction of samples on a known substrate. The advantage of this method is that it relies on noniterative reflection-only (air- and metal-backed) scattering (S-) parameters so that it is a good candidate for the characterization of samples when only one-port measurements are available. It is validated by the X-band (8.2-12.4 GHz) waveguide S-parameter measurements. A sensitivity analysis is followed to evaluate and improve the performance of our method.