Parameter Retrieval of Samples on a Substrate From Reflection-Only Waveguide Measurements


Hasar U. C., Ozturk H., Kaya Y., Izginli M., ERTUĞRUL M.

IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, vol.31, no.3, pp.320-323, 2021 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 31 Issue: 3
  • Publication Date: 2021
  • Doi Number: 10.1109/lmwc.2020.3046697
  • Journal Name: IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus, PASCAL, Aerospace Database, Communication Abstracts, Compendex, INSPEC, Metadex, Civil Engineering Abstracts
  • Page Numbers: pp.320-323
  • Karadeniz Technical University Affiliated: No

Abstract

A microwave method has been proposed for constitutive parameters' extraction of samples on a known substrate. The advantage of this method is that it relies on noniterative reflection-only (air- and metal-backed) scattering (S-) parameters so that it is a good candidate for the characterization of samples when only one-port measurements are available. It is validated by the X-band (8.2-12.4 GHz) waveguide S-parameter measurements. A sensitivity analysis is followed to evaluate and improve the performance of our method.