Complex Permittivity and Thickness Evaluation of Low-Loss Dielectrics From Uncalibrated Free-Space Time-Domain Measurements

Hasar U. C., Kaya Y., Ozturk H., Izginli M., Barroso J. J., Ramahi O. M., ...More

IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING, vol.60, 2022 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 60
  • Publication Date: 2022
  • Doi Number: 10.1109/tgrs.2021.3090712
  • Journal Name: IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, PASCAL, Aerospace Database, Applied Science & Technology Source, Aquatic Science & Fisheries Abstracts (ASFA), Business Source Elite, Business Source Premier, CAB Abstracts, Communication Abstracts, Compendex, Computer & Applied Sciences, Geobase, INSPEC, Metadex, Pollution Abstracts, Civil Engineering Abstracts
  • Karadeniz Technical University Affiliated: No

Abstract

A free-space time-domain method is proposed to retrieve dielectric constant (epsilon r), conductivity (sigma e), and thickness (d) of metal-backed low-loss dielectric samples using calibration-independent reflected power peak measurements. Its algorithm is validated by numerical calculations and simulations (CST Microwave Studio) using a sine-modulated Gaussian window. A sensitivity analysis is followed to examine its performance considering the dependencies of reflected power peaks with respect to epsilon r and sigma e. Free-space time-domain measurements have been implemented after transforming frequency-domain measurements into time-domain ones to extract epsilon r, sigma e, and d of polypropylene, polyethylene, and polyoxymethylene samples.