Determination of Valance Electronic Structure of Cu and Zn in Cu1-xZnx alloy thin films by using Kb-to-Ka X-ray Intensity Ratios | AVESİS

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Determination of Valance Electronic Structure of Cu and Zn in Cu1-xZnx alloy thin films by using Kb-to-Ka X-ray Intensity Ratios

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Cengiz E., KÖKSAL O. K., KARAHAN İ. H., Özdemir R., APAYDIN G.

European Conference on X-Ray Spectrometry, Ljubljana, Slovenia, 24 - 29 June 2018, pp.59

Publication Type: Conference Paper / Summary Text
City: Ljubljana
Country: Slovenia
Page Numbers: pp.59
Karadeniz Technical University Affiliated: Yes