Determination of Valance Electronic Structure of Cu and Zn in Cu1-xZnx alloy thin films by using Kb-to-Ka X-ray Intensity Ratios
European Conference on X-Ray Spectrometry, Ljubljana, Slovenia, 24 - 29 June 2018, pp.59, (Summary Text)
- Publication Type: Conference Paper / Summary Text
- City: Ljubljana
- Country: Slovenia
- Page Numbers: pp.59
- Karadeniz Technical University Affiliated: Yes