Determination of Valance Electronic Structure of Cu and Zn in Cu1-xZnx alloy thin films by using Kb-to-Ka X-ray Intensity Ratios


Cengiz E., KÖKSAL O. K. , KARAHAN İ. H. , Özdemir R., APAYDIN G.

European Conference on X-Ray Spectrometry, Ljubljana, Slovenia, 24 - 29 June 2018, pp.59

  • Publication Type: Conference Paper / Summary Text
  • City: Ljubljana
  • Country: Slovenia
  • Page Numbers: pp.59