A procedure to reduce side lobes of reflection wavelets: A contribution to low frequency information


KARSLI H. , DONDURUR D.

JOURNAL OF APPLIED GEOPHYSICS, vol.96, pp.107-118, 2013 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 96
  • Publication Date: 2013
  • Doi Number: 10.1016/j.jappgeo.2013.07.002
  • Title of Journal : JOURNAL OF APPLIED GEOPHYSICS
  • Page Numbers: pp.107-118

Abstract

Side lobes of the wavelets arise from the lack of low frequency content in a reflection wavelet. They tend to increase the time span of an individual reflection event and interfere with the other primary reflections or side lobes. Furthermore, their trace-by-trace consistency may produce pseudo-reflections and may cause misinterpretations of the side lobes as weak reflections.