Two-step numerical procedure for complex permittivity retrieval of dielectric materials from reflection measurements

Hasar, Ugur; Barroso, Joaquim; Kaya, Yunus; ERTUĞRUL, MEHMET; Bute, Musa; Catala-Civera, Jose

doi:10.1007/s00339-014-8303-9

Two-step numerical procedure for complex permittivity retrieval of dielectric materials from reflection measurements

Atıf İçin Kopyala

Hasar U. C., Barroso J. J., Kaya Y., ERTUĞRUL M., Bute M., Catala-Civera J. M.

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, cilt.116, sa.4, ss.1701-1710, 2014 (SCI-Expanded)

Yayın Türü: Makale / Tam Makale
Cilt numarası: 116 Sayı: 4
Basım Tarihi: 2014
Doi Numarası: 10.1007/s00339-014-8303-9
Dergi Adı: APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
Sayfa Sayıları: ss.1701-1710
Karadeniz Teknik Üniversitesi Adresli: Hayır

Özet

A two-step measurement procedure has been proposed for measurement of complex permittivity of dielectric materials using one-port reflection measurements. In the procedure, as a first step, a graphical method is applied to analyze on the complex reflection-coefficient plane the general pattern of dielectric behavior of the sample. Then, as a second step, optimization algorithms are utilized for retrieving electrical properties of samples. The procedure requires measurement of complex reflection scattering parameters of at least two samples with different lengths. It has been validated by X-band measurements of three polyvinyl chloride samples with lengths 5, 10, and 20 mm.