Akademik Veri Yönetim Sistemi
7th Pak-Turk International Conference on Emerging Technologies in the Field of Sciences and Engineering, Wah Cantonment, Pakistan, 14 - 15 Ekim 2024, ss.1
Single Photon Emission Tomography (SPECT) is an effective diagnostic imaging device. Its working principle is basically based on the principle of counting the gamma rays emitted from the radiopharmaceutical substance administered to the patient's body and creating cross-sectional images by processing them in the computer system. The quality of the images obtained is very important for the correct diagnosis of diseases. One of the important factors affecting image quality in SPECT applications is the dead layer that may form over time in the scintillation crystal, one of the detector components.
In this study, the effect of dead layers that may form in the NaI(Tl) scintillation crystal used in SPECT on the system performance was examined. For this purpose, GATE simulation code based on GEANT4, a simulation package based on the Monte Carlo method, was used. First, SPECT performance parameters (Sensitivity, spatial resolution, energy resolution, contrast) were examined by simulating the standard SPECT model at low, medium and high gamma energies. Then, dead layers of different thicknesses were created on the simulated crystal and the effect of the dead layer on the performance parameters was investigated for the same energies. As a result, it was revealed that significant deterioration occurred in the image quality parameters of the SPECT system due to the increase in the dead layer of the scintillation crystal.