K shell fluorescence yield of Cd and Zn in Cd1-xZnxS thin films

BACAKSIZ E., Cevik U.

CHEMICAL PHYSICS LETTERS, vol.427, pp.132-136, 2006 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 427
  • Publication Date: 2006
  • Doi Number: 10.1016/j.cplett.2006.05.117
  • Journal Name: CHEMICAL PHYSICS LETTERS
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.132-136
  • Karadeniz Technical University Affiliated: Yes

Abstract

The K shell fluorescence yield omega(K) of Cd and Zn in Cd1-xZnxS semiconductors has been studied. Energy dispersive X-ray fluorescence (EDXRF) technique was used to measure K X-ray photons. Cd and Zn elements were excited by using 59.5 keV photons emitted by a 50 mCi(241) Am radioactive source. The emitted characteristic K X-rays were detected by a Si (Li) detector having a resolution of 160 eV at 5.9 keV. It was found that the K shell fluorescence yield COK changed in Cd1-xZnxS thin films for different compositions of x. (c) 2006 Elsevier B.V. All rights reserved.