Synthesis and characterizations of Ce-doped ZnO thin films for radiation shielding

Soğuksu A. K., Kerli S., Kavun Y., ALVER Ü.

Optical Materials, vol.148, 2024 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 148
  • Publication Date: 2024
  • Doi Number: 10.1016/j.optmat.2024.114941
  • Journal Name: Optical Materials
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, PASCAL, Aerospace Database, Applied Science & Technology Source, Chimica, Communication Abstracts, Compendex, Computer & Applied Sciences, INSPEC
  • Keywords: Gamma, NaI(Tl) detector, Thin film
  • Karadeniz Technical University Affiliated: Yes


In this research, different amounts of Ce-doped ZnO thin films were synthesized using the spray pyrolysis method. Structural, morphological and optical properties of these synthesized films were investigated. In XRD analyses, wurtzite (hexagonal) structures were observed in the films. In SEM analysis, there were changes in the surface morphology of the films with doping, and in cross-section measurement, the thickness of the films was measured to be approximately 1.2 μm. In UV–vis spectrometry analysis, it is seen that the effect of Cerium contribution on optical transmittance and band gap positively affects shielding. NaI(Tl) detector and gamma energies of 384, 1173, and 1333 keV have been used to investigate the radiation protection properties of these synthesized films. As a result of these measurements, linear attenuation coefficient (LAC) values have been obtained. Radiation shielding parameters have been calculated with these (LAC) values. The Mass Attenuation Coefficient (MAC), Half Value Layer (HVL), Tenth Value Layer TVL (and) Mean Free Path (MFP) values have been also calculated using this LAC result. According to these results, Ce-doped ZnO films were found to be effective in radiation shielding.