Effect of low molarity HfO2 thin films on the reflectance properties of polished silicon substrate

Kanmaz I., Güzeldir B., Üzüm A.

1. Uluslararası Palandöken Bilimsel Çalışmalar Kongresi, 24 - 25 November 2020, pp.95, (Summary Text)

  • Publication Type: Conference Paper / Summary Text
  • Page Numbers: pp.95
  • Karadeniz Technical University Affiliated: Yes