Simple procedure for robust and accurate complex permittivity measurements of low-loss materials over a broad frequency band
JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS, cilt.28, sa.8, ss.903-915, 2014 (SCI-Expanded, Scopus)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 28 Sayı: 8
- Basım Tarihi: 2014
- Doi Numarası: 10.1080/09205071.2014.896227
- Dergi Adı: JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS
- Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
- Sayfa Sayıları: ss.903-915
- Karadeniz Teknik Üniversitesi Adresli: Hayır
Özet
In this research paper, we propose a simple procedure for accurate, stable and broadband measurements of complex permittivity of low-loss dielectric samples with considerable lengths. We identify and demonstrate by numerical and analytical analyses the main ill-behaved factor that gives rise to inaccurate peaks for measurements of electrical properties of low-loss samples in the well-known Nicolson-Ross-Weir method. Without using this factor in the expressions and combining better features of the methods available in the literature, the proposed procedure allows highly accurate permittivity measurements over a broad band. We have validated the proposed method by permittivity measurements of a low-loss sample by different methods.