Six-Inch High-Purity Lead Halide Perovskite Wafer Derived from Ceramic Manufacturing Technique

Liu S., Ding Y., Li Y., Rong W., Xu Y., Zhao X., ...Daha Fazla

Advanced Functional Materials, cilt.35, sa.43, 2025 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 35 Sayı: 43
  • Basım Tarihi: 2025
  • Doi Numarası: 10.1002/adfm.202506879
  • Dergi Adı: Advanced Functional Materials
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, Aerospace Database, Applied Science & Technology Source, Chemical Abstracts Core, Chimica, Communication Abstracts, Compendex, INSPEC, MEDLINE, Metadex, Civil Engineering Abstracts, Nature Index
  • Anahtar Kelimeler: ceramic, heterojunction, perovskites wafer, six-inch, X-ray array
  • Karadeniz Teknik Üniversitesi Adresli: Evet

Özet

Lead halide perovskites exhibit exceptional optoelectronic properties but face industrialization barriers due to the inability to fabricate large-area, high-quality wafers. Inspired by ceramic manufacturing techniques, a 6-inch high-purity perovskite wafer is developed, achieving carrier mobility, lifetime, and defect concentrations comparable to single crystals. This method demonstrates universality across diverse perovskites and enables heterojunction wafers, marking significant progress in carrier dynamics control. As a result, an X-ray sensing array with 256 × 256 pixels is constructed using a 10 × 10 cm2 perovskite heterojunction wafer, which exhibits a sensitivity of 36532 µCGyair−1 cm−2 and a low detection limit of 139 nGyair s−1, superior to those in a single-crystal detector (10640 µCGyair−1 cm−2 and 247 nGyair s−1). This breakthrough establishes a scalable pathway to industrial-scale perovskite optoelectronics, overcoming critical manufacturing barriers while enabling high-performance radiation imaging systems through wafer-level heterostructure engineering.