Investigation of The Effect of Annealing on Resistivity in Aluminum-based Amorphous Alloys

Creative Commons License

Kerli S., Alver U., Gogebakan M.

PHYSICS AND CHEMISTRY OF SOLID STATE, cilt.20, sa.4, ss.391-395, 2019 (ESCI) identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 20 Sayı: 4
  • Basım Tarihi: 2019
  • Doi Numarası: 10.15330/pcss.20.4.391-395
  • Dergi Adı: PHYSICS AND CHEMISTRY OF SOLID STATE
  • Derginin Tarandığı İndeksler: Emerging Sources Citation Index (ESCI), Scopus
  • Sayfa Sayıları: ss.391-395
  • Karadeniz Teknik Üniversitesi Adresli: Evet

Özet

In this study, electrical properties of Al-Y-Ni alloys produced by melt-spinning method were investigated. Before annealing, XRD analyzes were performed and the samples were found to be amorphous. Exothermic peaks were observed in DSC measurements and crystallization stages of the alloys were determined. Al85Y11Ni4, Al85Y10Ni5 and Al85Y5Ni10 samples were annealed at some temperature and their electrical resistivity was measured by four-point method. The large decrease in resistivity was observed during crystallization between 200 - 400 degrees C. These results were consistent with XRD and DSC measurements.