Measurement of the enhancement effect in different sample series in X-ray fluorescence analysis


Tirasoglu E., Dogan O., Cevik U., Ertugrul M., Erdogan H.

JOURNAL OF TRACE AND MICROPROBE TECHNIQUES, vol.19, no.1, pp.99-106, 2001 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 19 Issue: 1
  • Publication Date: 2001
  • Doi Number: 10.1081/tma-100001465
  • Journal Name: JOURNAL OF TRACE AND MICROPROBE TECHNIQUES
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.99-106
  • Keywords: EDXRF, enhancement effect, matrix effect
  • Karadeniz Technical University Affiliated: Yes

Abstract

The dependence of the enhancement effect on the element concentration in the sample matrix has been investigated by energy dispersive X-ray fluorescence analysis. The values of the enhancement effect factors for La2O3-Pr6O11-Sm2O3, La2O3-Sb-Eu2O3, and La2O3-Sm2O3-Gd2O3 at 59.5 keV incident photon energy have been measured.