Measurement of the enhancement effect in different sample series in X-ray fluorescence analysis


Tirasoglu E., Dogan O., Cevik U., Ertugrul M., Erdogan H.

JOURNAL OF TRACE AND MICROPROBE TECHNIQUES, cilt.19, ss.99-106, 2001 (SCI İndekslerine Giren Dergi) identifier identifier

  • Cilt numarası: 19 Konu: 1
  • Basım Tarihi: 2001
  • Doi Numarası: 10.1081/tma-100001465
  • Dergi Adı: JOURNAL OF TRACE AND MICROPROBE TECHNIQUES
  • Sayfa Sayıları: ss.99-106

Özet

The dependence of the enhancement effect on the element concentration in the sample matrix has been investigated by energy dispersive X-ray fluorescence analysis. The values of the enhancement effect factors for La2O3-Pr6O11-Sm2O3, La2O3-Sb-Eu2O3, and La2O3-Sm2O3-Gd2O3 at 59.5 keV incident photon energy have been measured.